Dimensional Measurement Products:

ATMeasure - General Purpose Field-of-view Vision Metrology software
Applications: Semiconductor, Electronic Device and Packaging, Optics, Flat Panel Display, MEMS, Medical Device.

CDMeasure – Critical Dimension Measurement System
Applications: Semiconductor, Flat Panel Display, LED, Optics

Surface Measurement and Profiling Products:

WaferScan – Wafer Bow & Warp Geometry
Applications: Semiconductor, Flat Panel Display, Optics

HRT 3000 - Non-Contact Optical Profilometer
Applications: Semiconductor, Electronic Device and Packaging, Optics, Flat Panel Display, LED, MEMS, Hard Disk Drive

Automated Wafer Defect Inspection and Classification:

WaferInspect - Wafer Inspection System

Special Products:

EtherGlow Illumination - Patented Illumination Technology
Applications: General

Application Specific Systems - Customized Metrology and Defect Detection Systems
Applications: Semiconductor, Flat Panel Display, LED, MEMS, Hard Disk Drive