HRT 3000™ - Non-Contact Optical Profilometer

The HRT 3000 is a non-contact profilometer designed specifically to measure high aspect ratio trenches found in semiconductors and MEMS devices. The many features built into the HRT 3000 make it very flexible and allow it to operate in production as well as research environments. The software is both simple to use and powerful enough to solve numerous metrology problems.

Some of the many applications Tamar has addressed with the HRT 3000 are:

  • High Aspect Ratio Trenches depth and width for semiconductors
  • MEMS etch depth and width
  • Fresnel lens step measurement
  • Surface profile of optical components and crystals
  • Solder bumps and micro bumps.
  • Micro-fluidic chips
  • Flat Panel Display Photo Spacer Height
  • Flat Panel Display Layer Thickness

In addition to our standard HRT 3000, we routinely build specific configurations to solve specific applications.


Registration & PDF Download

 


HRT3000 Specifications
Objective Lens Height Range (um) Spot Size (um) Height resolution (um)
5x 2000 15 0.5
10x 1000 11 0.1
20x 250 5 0.05
50x 40 2 0.01

 

Scan rates from .001 mm/sec to 25 mm/sec
Scan distance up to 100 mm
Samples rates 2 ms minimum
Dynamic range 40dB
Scans in any direction
Dynamic integration option during scan
Live video during scan
High/Low pass filtering of data option before calculations
Automatically calculated ANSI standard roughness/waviness
Numerous other calculations available
Raw Data export for offline processing

 


All Products

Dimensional Measurement Products:

ATMeasure - General Purpose Field-of-view Vision Metrology software
Applications: Semiconductor, Electronic Device and Packaging, Optics, Flat Panel Display, MEMS, Medical Device.

CDMeasure – Critical Dimension Measurement System
Applications: Semiconductor, Flat Panel Display, LED, Optics

Surface Measurement and Profiling Products:

WaferScan – Wafer Bow & Warp Geometry
Applications: Semiconductor, Flat Panel Display, Optics

HRT 3000 - Non-Contact Optical Profilometer
Applications: Semiconductor, Electronic Device and Packaging, Optics, Flat Panel Display, LED, MEMS, Hard Disk Drive

Automated Wafer Defect Inspection and Classification:

WaferInspect - Wafer Inspection System

Special Products:

EtherGlow Illumination - Patented Illumination Technology
Applications: General

Application Specific Systems - Customized Metrology and Defect Detection Systems
Applications: Semiconductor, Flat Panel Display, LED, MEMS, Hard Disk Drive

 

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996 Lawrence Drive, Suite 202 • Newbury Park, CA 91320 • (805) 480-3358