Tamar Technology - Product Descriptions

Application Specific Systems - Customized Metrology and Defect Detection Systems

If you have a vision metrology or inspection problem and don’t see your solution, please give Tamar a call to discuss your application with one of our application engineers. We build specials as a matter of course and have a long history of specialized vision measurement systems. From satellite cameras to surgical staplers to MEMS devices, Tamar will use their proprietary technology to satisfy your application needs.

All Products

Dimensional Measurement Products:

ATMeasure - General Purpose Field-of-view Vision Metrology software
Applications: Semiconductor, Electronic Device and Packaging, Optics, Flat Panel Display, MEMS, Medical Device.

CDMeasure – Critical Dimension Measurement System
Applications: Semiconductor, Flat Panel Display, LED, Optics

Surface Measurement and Profiling Products:

WaferScan – Wafer Bow & Warp Geometry
Applications: Semiconductor, Flat Panel Display, Optics

HRT 3000 - Non-Contact Optical Profilometer
Applications: Semiconductor, Electronic Device and Packaging, Optics, Flat Panel Display, LED, MEMS, Hard Disk Drive

Automated Wafer Defect Inspection and Classification:

WaferInspect - Wafer Inspection System

Special Products:

EtherGlow Illumination - Patented Illumination Technology
Applications: General

Application Specific Systems - Customized Metrology and Defect Detection Systems
Applications: Semiconductor, Flat Panel Display, LED, MEMS, Hard Disk Drive

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