Optical Profilometer, Wafer Thickness, Vision Metrology, & Defect
Detection By Tamar Technology
Tamar Technology offers
precision metrology and
automated
inspection systems to the
semiconductor, MEMS, FPD, LED
and Medical device industries, as well as other high technology industries, using
proprietary
Machine Vision and
Optical Stylus Probe Technologies
Machine Vision
Tamar enhances our customer’s productivity by supplying precision
metrology systems for CD measure and many application
specific systems.
Optical Profilometry
Tamar’s proprietary Optical Stylus (patent pending) technology
is used in the HRT 3000 profilometer as well as WaferScan
for wafer thickness metrology.
